XRD
X-Ray Diffractometer
XRD
X-ray crystallography is a method based on the diffraction of X-ray beams in various directions specific to the crystal structure. It allows for the analysis of powders, thin films, and bulk materials. The X-ray diffraction analysis method is non-destructive and enables the characterization of even very small amounts of samples. With the XRD instrument, phase analysis (search-match) and Rietveld analysis (structural refinement) can be performed alongside diffraction profiles. XRD measurements provide critical data regarding the phases present in a material, their relative proportions, crystallite size, lattice parameters, structural variations, crystal orientation, and atomic positions.
Technical Specifications
- X-Ray Source: Cu-Kα with Ni filter
- Source Voltage: 10–60 Kv
- Source Current: 5–60 mA
- Maximum Output Power: 3 kW
- Normal Scan Speed: 0.1° (2θ/s)
- Scanning Range: -111° < 2θ < 168°
Primary Application Areas
- Structural analysis of synthesized materials
- Analysis of metals and alloys
- Identification of minerals and rocks in geology
- Detection of polymorphs and impurities in materials
- Diffraction imaging for textile fibers and fabrics
- Analysis of polymers
- Composition determination of thin films
- Identification of materials forming historical structures in archaeology