ICP-OES

XRF

X-ray Fluorescence (XRF) spectrometry is an instrument generally used for the qualitative and quantitative evaluation of characteristic X-rays and scattering photons resulting from photon-matter interaction. Energy Dispersive X-Ray Fluorescence (EDXRF) spectrometry is a suitable technique for the analysis of solid, liquid, and powder materials due to its rapid, non-destructive, cost-effective, precise, and multi-element analysis capabilities. The analytical range of the EDXRF system covers elements with atomic numbers from 11 (Sodium) to 92 (Uranium).

Technical Specifications

  • Detector Type: Palladium (Pd) Detector
  • Cooling System: Peltier Cooling
  • Gas Type: Helium (He) (Flow rate of 80–85 L/h during measurement)
  • Measurement Range: Sodium to Uranium (Na–U)

Primary Application Areas

  • Fundamental physics research
  • Alloy analysis in metallurgy
  • Analysis of mineral ores
  • Radioactive ore analysis
  • Impurity analysis of industrial materials